Parametric probe card
Semiconductor Test Architects
Semiconductor Parametric Test, Reliability Test, Multi-Site/Die Test
- Company：STAr Technologies, Inc. STAr Technologies, Inc.
- Price：Other
Probe Card(mi) - List of Manufacturers, Suppliers, Companies and Products
Probe Card Product List
1～3 item / All 3 items
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Koyo Technos manufactured probe guard for semiconductor wafer inspection.
High-speed multi-inspection has become possible.
The vertical probe VBP-C method enables high-speed multi-testing.
- Company：コーヨーテクノス
- Price：Other
Kanesho PWS Corporation Business Introduction
Leave it to us for technical consulting in semiconductor, LCD, and electronic component manufacturing!
Kanematsu PWS Corporation is a company primarily engaged in the development, design, manufacturing, and sales of semiconductor manufacturing and inspection equipment. Our main products include equipment-related units and parts such as "wafer probe cards," "polishing films," and "Post CMP Blush." In addition, we provide technical services such as the design and manufacturing of various labor-saving devices, installation and maintenance of our own equipment, and imported semiconductor manufacturing and inspection equipment. Please feel free to contact us if you have any requests. 【Business Introduction】 ■ Development, design, manufacturing, and sales of semiconductor manufacturing/inspection equipment ■ Technical services ■ Sales, brokerage, maintenance services, setup, and modification of used semiconductor manufacturing equipment *For more details, please refer to our catalog or feel free to contact us.
- Company：兼松ＰＷＳ
- Price：Other
