Parametric probe card
Semiconductor Test Architects
Semiconductor Parametric Test, Reliability Test, Multi-Site/Die Test
- Company:STAr Technologies, Inc. STAr Technologies, Inc.
- Price:Other
1~3 item / All 3 items
Semiconductor Test Architects
Semiconductor Parametric Test, Reliability Test, Multi-Site/Die Test
High-speed multi-inspection has become possible.
The vertical probe VBP-C method enables high-speed multi-testing.
Leave it to us for technical consulting in semiconductor, LCD, and electronic component manufacturing!
Kanematsu PWS Corporation is a company primarily engaged in the development, design, manufacturing, and sales of semiconductor manufacturing and inspection equipment. Our main products include equipment-related units and parts such as "wafer probe cards," "polishing films," and "Post CMP Blush." In addition, we provide technical services such as the design and manufacturing of various labor-saving devices, installation and maintenance of our own equipment, and imported semiconductor manufacturing and inspection equipment. Please feel free to contact us if you have any requests. 【Business Introduction】 ■ Development, design, manufacturing, and sales of semiconductor manufacturing/inspection equipment ■ Technical services ■ Sales, brokerage, maintenance services, setup, and modification of used semiconductor manufacturing equipment *For more details, please refer to our catalog or feel free to contact us.